Digital Library
Search: "[ keyword: Testing ]" (12)
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Kiho Choi, Seongseop Kim, Daejin Park, Jeonghun Cho
Vol. 15, No. 6, pp. 1462-1471, Dec. 2019
10.3745/JIPS.01.0047
Keywords: Binary Translation, Dynamic Testing, Software Monitoring -
Jin-Wook Jang
Vol. 14, No. 3, pp. 607-620, Jun. 2018
10.3745/JIPS.04.0072
Keywords: Automobile Control Software, Risk-based Test, Software Testing Process, Test Design, Test Planning, Test Policy and Strategy, TMMi Assessment -
Sangeeta Sabharwal, Manuj Aggarwal
Vol. 13, No. 5, pp. 1089-1102, Oct. 2017
10.3745/JIPS.04.0019
Keywords: Combinatorial Testing, Genetic Algorithm, Mixed Covering Arrays, Pairwise Testing, Test Set, t-way Testing -
S, eep K. Singh, Sangeeta Sabharwal, J.P.Gupta
Vol. 8, No. 2, pp. 213-240, Jun. 2012
10.3745/JIPS.2012.8.2.213
Keywords: events, Event Meta Model, Testing, Test Cases, Test scenarios, Event Based Systems, Software Engineering -
Praveen Ranjan Srivastava
Vol. 8, No. 1, pp. 21-54, Mar. 2012
10.3745/JIPS.2012.8.1.021
Keywords: Software Testing, Fuzzy Multi-Criteria Approach, Fuzzy Logic, Fuzzy Rules Based, Confidence, Centre of Gravity, Fault Tolerance, Kilo Line of Code (KLOC), Software Development Effort (SDE), Software Test Effort (STE), Decision Makers (DM) -
Ruchika Malhotra, Mohit Garg
Vol. 7, No. 2, pp. 363-384, Jun. 2011
10.3745/JIPS.2011.7.2.363
Keywords: Software Testing, Adequacy Based Testing Criteria, Reliability Based Testing Criteria, Genetic Algorithms, Mutation Analysis -
Chetna Gupta, Yogesh Singh, Durg Singh Chauhan
Vol. 6, No. 4, pp. 597-608, Dec. 2010
10.3745/JIPS.2010.6.4.597
Keywords: Change Impact Analysis, Regression Testing, Software Maintenance, Software Testing -
Maneesha Srivasatav, Yogesh Singh, Durg Singh Chauhan
Vol. 6, No. 4, pp. 537-552, Dec. 2010
10.3745/JIPS.2010.6.4.537
Keywords: clustering, Debugging, Fault Localization, Optimization, Software Testing -
Ruchika Malhotra, Arvinder Kaur, Yogesh Singh
Vol. 6, No. 2, pp. 235-252, Jun. 2010
10.3745/JIPS.2010.6.2.235
Keywords: Regression Testing, Maintenance, Prioritization -
Pin Ng, Richard Y. K. Fung, Ray W. M. Kong
Vol. 6, No. 2, pp. 197-208, Jun. 2010
10.3745/JIPS.2010.6.2.197
Keywords: Test Suite Reduction, Model-Based Testing, State Machine Model, Formal Concept Analysis