A Novel Approach for Deriving Test Scenarios and Test Cases from Events
S, eep K. Singh, Sangeeta Sabharwal, J.P.Gupta, Journal of Information Processing Systems Vol. 8, No. 2, pp. 213-240, Jun. 2012
https://doi.org/10.3745/JIPS.2012.8.2.213
Keywords: events, Event Meta Model, Testing, Test Cases, Test scenarios, Event Based Systems, Software Engineering
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Cite this article
[APA Style]
, Singh, e., Sabharwal, S., & (2012). A Novel Approach for Deriving Test Scenarios and Test Cases from Events. Journal of Information Processing Systems, 8(2), 213-240. DOI: 10.3745/JIPS.2012.8.2.213.
[IEEE Style]
S, e. K. Singh, S. Sabharwal, J.P.Gupta, "A Novel Approach for Deriving Test Scenarios and Test Cases from Events," Journal of Information Processing Systems, vol. 8, no. 2, pp. 213-240, 2012. DOI: 10.3745/JIPS.2012.8.2.213.
[ACM Style]
S, eep K. Singh, Sangeeta Sabharwal, and J.P.Gupta. 2012. A Novel Approach for Deriving Test Scenarios and Test Cases from Events. Journal of Information Processing Systems, 8, 2, (2012), 213-240. DOI: 10.3745/JIPS.2012.8.2.213.