Improved Deep Residual Network forApple Leaf Disease Identification


Changjian Zhou, Jinge Xing, Journal of Information Processing Systems Vol. 17, No. 6, pp. 1115-1126, Dec. 2021  

https://doi.org/10.3745/JIPS.04.0228
Keywords: Agricultural Artificial Intelligence, computer vision, Deep Learning
Fulltext:

Abstract

Plant disease is one of the most irritating problems for agriculture growers. Thus, timely detection of plant diseases is of high importance to practical value, and corresponding measures can be taken at the early stage of plant diseases. Therefore, numerous researchers have made unremitting efforts in plant disease identification. However, this problem was not solved effectively until the development of artificial intelligence and big data technologies, especially the wide application of deep learning models in different fields. Since the symptoms of plant diseases mainly appear visually on leaves, computer vision and machine learning technologies are effective and rapid methods for identifying various kinds of plant diseases. As one of the fruits with the highest nutritional value, apple production directly affects the quality of life, and it is important to prevent disease intrusion in advance for yield and taste. In this study, an improved deep residual network is proposed for apple leaf disease identification in a novel way, a global residual connection is added to the original residual network, and the local residual connection architecture is optimized. Including that 1,977 apple leaf disease images with three categories that are collected in this study, experimental results show that the proposed method has achieved 98.74% top-1 accuracy on the test set, outperforming the existing state-of-the-art models in apple leaf disease identification tasks, and proving the effectiveness of the proposed method.


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Cite this article
[APA Style]
Zhou, C. & Xing, J. (2021). Improved Deep Residual Network forApple Leaf Disease Identification. Journal of Information Processing Systems, 17(6), 1115-1126. DOI: 10.3745/JIPS.04.0228.

[IEEE Style]
C. Zhou and J. Xing, "Improved Deep Residual Network forApple Leaf Disease Identification," Journal of Information Processing Systems, vol. 17, no. 6, pp. 1115-1126, 2021. DOI: 10.3745/JIPS.04.0228.

[ACM Style]
Changjian Zhou and Jinge Xing. 2021. Improved Deep Residual Network forApple Leaf Disease Identification. Journal of Information Processing Systems, 17, 6, (2021), 1115-1126. DOI: 10.3745/JIPS.04.0228.