Incremental Model-based Test Suite Reduction with Formal Concept Analysis


Pin Ng, Richard Y. K. Fung, Ray W. M. Kong, Journal of Information Processing Systems Vol. 6, No. 2, pp. 197-208, Jun. 2010  

https://doi.org/10.3745/JIPS.2010.6.2.197
Keywords: Test Suite Reduction, Model-Based Testing, State Machine Model, Formal Concept Analysis
Fulltext:

Abstract

Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios and a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to determine incrementally a minimal set of test scenarios with adequate test coverage.


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Cite this article
[APA Style]
Ng, P., Fung, R., & Kong, R. (2010). Incremental Model-based Test Suite Reduction with Formal Concept Analysis. Journal of Information Processing Systems, 6(2), 197-208. DOI: 10.3745/JIPS.2010.6.2.197.

[IEEE Style]
P. Ng, R. Y. K. Fung, R. W. M. Kong, "Incremental Model-based Test Suite Reduction with Formal Concept Analysis," Journal of Information Processing Systems, vol. 6, no. 2, pp. 197-208, 2010. DOI: 10.3745/JIPS.2010.6.2.197.

[ACM Style]
Pin Ng, Richard Y. K. Fung, and Ray W. M. Kong. 2010. Incremental Model-based Test Suite Reduction with Formal Concept Analysis. Journal of Information Processing Systems, 6, 2, (2010), 197-208. DOI: 10.3745/JIPS.2010.6.2.197.