Digital Library
Search: "[ keyword: pattern ]" (25)
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Chengyou Wang, Heng Zhang, Xiao Zhou
Vol. 14, No. 3, pp. 666-679, Jun. 2018
10.3745/JIPS.03.0096
Keywords: Discrete wavelet transform (DWT), Fragile Watermarking, Image Authentication, Local Binary Pattern (LBP), Semi-blind Detection -
Chunfang Liu
Vol. 14, No. 3, pp. 790-800, Jun. 2018
10.3745/JIPS.04.0078
Keywords: Multi-Criteria Decision-Making, Pattern Recognition, Similarity Measure, Simplified Neutrosophic Sets -
Dayou Jiang, Jongweon Kim
Vol. 13, No. 6, pp. 1628-1639, Dec. 2017
10.3745/JIPS.02.0077
Keywords: dual-tree complex wavelet transform, Image Retrieval, Local Binary Pattern, SVD, Texture Feature -
Xiaohan Sun, Junying Zhang
Vol. 13, No. 6, pp. 1527-1543, Dec. 2017
10.3745/JIPS.04.0051
Keywords: Deep Sequencing Data, miRNA, Pattern Discovery -
Heng Zhang, Chengyou Wang, Xiao Zhou
Vol. 13, No. 5, pp. 1382-1396, Oct. 2017
10.3745/JIPS.02.0063
Keywords: Digital image watermarking, Semi-fragile Watermarking, False Detection, Local Binary Pattern (LBP), Arnold Transform -
Heng Zhang, Chengyou Wang, Xiao Zhou
Vol. 13, No. 2, pp. 385-399, Apr. 2017
10.3745/JIPS.03.0070
Keywords: fragile watermarking, Local Binary Pattern (LBP), Least Significant Bit (LSB), Tamper Detection and Localization -
Jitdumrong Preechasuk, Punpiti Piamsa-nga
Vol. 11, No. 4, pp. 538-555, Dec. 2015
10.3745/JIPS.02.0035
Keywords: Dynamic Grid Feature, Event Detection, Event Patterns, Pedestrian Activities -
Yuan-Hong Zhong, Zhi-Yong Huang, Bin Zhu, Hua Wu
Vol. 11, No. 3, pp. 342-353, Sep. 2015
10.3745/JIPS.03.0028
Keywords: Compressive sensing, Random Pilot Pattern, SC-FDMA, Sparse Channel Estimation -
Khiat Salim, Belbachir Hafida, Rahal Sid Ahmed
Vol. 10, No. 1, pp. 145-161, Mar. 2014
10.3745/JIPS.2014.10.1.145
Keywords: Global Pattern, Maximum Entropy Method, Non-derivable Itemset, Itemset Inclusion-exclusion Model -
Nagappa Bhajantri, Pradeep Kumar R, Nagabhushan P
Vol. 9, No. 4, pp. 660-677, Dec. 2013
10.3745/JIPS.2013.9.4.660
Keywords: Camouflage, Line Mask, Enhancement, Texture analysis, Distribution pattern, histogram, Regression line