Digital Library
Search: "[ author: es ]" (40)
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Neda Rohani, Zainab Noferesti, Javad Mohajeri, Mohammad Reza Aref
Vol. 7, No. 1, pp. 151-158, Mar. 2011
10.3745/JIPS.2011.7.1.151
Keywords: Bivium, Guess and Determine Attack, Stream Ciphers, Linear Approximations, Entropy -
Aries Kusdaryono, Kyung Oh Lee
Vol. 7, No. 1, pp. 29-42, Mar. 2011
10.3745/JIPS.2011.7.1.029
Keywords: ad hoc network, Wireless Sensor Networks, Clustering, Routing Protocol -
Chetna Gupta, Yogesh Singh, Durg Singh Chauhan
Vol. 6, No. 4, pp. 597-608, Dec. 2010
10.3745/JIPS.2010.6.4.597
Keywords: Change Impact Analysis, Regression Testing, Software Maintenance, Software Testing -
Maneesha Srivasatav, Yogesh Singh, Durg Singh Chauhan
Vol. 6, No. 4, pp. 537-552, Dec. 2010
10.3745/JIPS.2010.6.4.537
Keywords: clustering, Debugging, Fault Localization, Optimization, Software Testing -
Manoj Kumar, Anjana Gosain, Yogesh Singh
Vol. 6, No. 3, pp. 385-402, Sep. 2010
10.3745/JIPS.2010.6.3.385
Keywords: Agent, Dependencies Among Agents, Stakeholders of the Organization, Data Warehouse Requirements Engineering, Early Requirements Engineering, Late Requirements Engineering -
Ruchika Malhotra, Arvinder Kaur, Yogesh Singh
Vol. 6, No. 2, pp. 235-252, Jun. 2010
10.3745/JIPS.2010.6.2.235
Keywords: Regression Testing, Maintenance, Prioritization -
Beatriz Neto, Lucia Fern, es, Claudia Werner, Jano Moreira de Souza
Vol. 6, No. 2, pp. 219-234, Jun. 2010
10.3745/JIPS.2010.6.2.219
Keywords: Games, Product Line, Software Reuse, Software Development -
Yogesh Singh, Arvinder Kaur, Bharti Suri
Vol. 6, No. 1, pp. 21-32, Mar. 2010
10.3745/JIPS.2010.6.1.021
Keywords: Regression Testing, Test Prioritization, Test Selection, Interprocedural -
Jeonghye Han, Miheon Jo, Vicki Jones, Jun H Jo
Vol. 4, No. 4, pp. 159-168, Dec. 2008
10.3745/JIPS.2008.4.4.159
Keywords: Human-Computer Interaction, Human-Robot Interaction, E-learning, Educational Media, r-Learning, Web-Based Instruction -
Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, Takeshi Asakawa
Vol. 4, No. 3, pp. 121-132, Sep. 2008
10.3745/JIPS.2008.4.4.121
Keywords: VLST test, VLSI tester, ATE, tester language, GTL, Tester selection tool