Digital Library
Search: "[ author: es ]" (40)
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Bharti Nagpal, Naresh Chauhan, Nanhay Singh
Vol. 13, No. 4, pp. 689-702, Aug. 2017
10.3745/JIPS.03.0024
Keywords: Dynamic Analysis, Detection, Prevention, SQL Injection Attack, Static Analysis, Vulnerabilities -
Suresh B. Rathod, V. Krishna Reddy
Vol. 13, No. 3, pp. 476-490, Jun. 2017
10.3745/JIPS.01.0015
Keywords: Cloud computing, Datacenter (DC), Host Controller, Physical Host, Virtual Machine (VM) -
Olivier Deschambault, Abdelouahed Gherbi, Christian Le?gare?
Vol. 13, No. 1, pp. 26-39, Feb. 2017
10.3745/JIPS.04.0028
Keywords: embedded systems, Internet of Things, Message Queue Telemetry Transport, Quality of Service -
Yeseul Park, Meeyeon Lee, Myung-Hee Kim, Jung-Won Lee
Vol. 12, No. 1, pp. 129-148, Mar. 2016
10.3745/JIPS.04.0021
Keywords: Acute Myocardial Infarction, Coronary Anatomy, Coronary Angiography, Data Model, Echocardiography, Medical Images, Multimodality, Semantic Features -
Geetanjali Rathee, Nitin Rakesh
Vol. 12, No. 1, pp. 57-72, Mar. 2016
10.3745/JIPS.03.0014
Keywords: WMN, Resiliency, BBR, Routing, RPT -
Minh Hieu Nguyen, Gueesang Lee
Vol. 11, No. 4, pp. 528-537, Dec. 2015
10.3745/JIPS.02.0026
Keywords: Connected Component, Interest Point, Tensor Voting, Text Detection -
Maheshi B. Dissanayake, Dilanga L. B. Abeyrathna
Vol. 11, No. 3, pp. 483-494, Sep. 2015
10.3745/JIPS.03.0036
Keywords: Complexity, Compression Efficiency, HEVC, H.264/AVC, Latency -
Tam Nguyen, Gueesang Lee
Vol. 11, No. 3, pp. 438-449, Sep. 2015
10.3745/JIPS.02.0023
Keywords: Mobile Camera, Music Score, SVM, Symbol Classification -
Jesmin Akhter, Md. Imdadul Islam, M. R. Amin
Vol. 10, No. 4, pp. 568-580, Dec. 2014
10.3745/JIPS.03.0016
Keywords: Blocking probability, CAC, Complete Partition Scheme, Subscriber Station, throughput -
Muhammad Zeeshan Arshad, Javeria Muhammad Nawaz, Sang Jeen Hong
Vol. 10, No. 3, pp. 429-442, Sep. 2014
10.3745/JIPS.04.0004
Keywords: Autoregressive Integrated Moving Average, Dynamic Time Warping, Fault Detection, Seasonal Autoregressive Integrated Moving Average, Semiconductor Process, Time Series Modeling