Industrial Process Monitoring and Fault Diagnosis Based on Temporal Attention Augmented Deep Network
Ke Mu, Lin Luo, Qiao Wang, Fushun Mao, Journal of Information Processing Systems Vol. 17, No. 2, pp. 242-252, Apr. 2021
https://doi.org/10.3745/JIPS.04.0211
Keywords: Deep Learning, Online Fault Classification, Recurrent Neural Networks, Temporal Attention Mechanism
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Cite this article
[APA Style]
Mu, K., Luo, L., Wang, Q., & Mao, F. (2021). Industrial Process Monitoring and Fault Diagnosis Based on Temporal Attention Augmented Deep Network. Journal of Information Processing Systems, 17(2), 242-252. DOI: 10.3745/JIPS.04.0211.
[IEEE Style]
K. Mu, L. Luo, Q. Wang, F. Mao, "Industrial Process Monitoring and Fault Diagnosis Based on Temporal Attention Augmented Deep Network," Journal of Information Processing Systems, vol. 17, no. 2, pp. 242-252, 2021. DOI: 10.3745/JIPS.04.0211.
[ACM Style]
Ke Mu, Lin Luo, Qiao Wang, and Fushun Mao. 2021. Industrial Process Monitoring and Fault Diagnosis Based on Temporal Attention Augmented Deep Network. Journal of Information Processing Systems, 17, 2, (2021), 242-252. DOI: 10.3745/JIPS.04.0211.