An Improved Defect Detection Algorithm of Jean Fabric Based on Optimized Gabor Filter
Shuangbao Ma, Wen Liu, Changli You, Shulin Jia, Yurong Wu, Journal of Information Processing Systems Vol. 16, No. 5, pp. 1008-1014, Oct. 2020
https://doi.org/10.3745/JIPS.02.0140
Keywords: Defect Detection, Denim Fabric, False Defect Removal, Gabor filter, Iterative Segmentation
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Cite this article
[APA Style]
Ma, S., Liu, W., You, C., Jia, S., & Wu, Y. (2020). An Improved Defect Detection Algorithm of Jean Fabric Based on Optimized Gabor Filter. Journal of Information Processing Systems, 16(5), 1008-1014. DOI: 10.3745/JIPS.02.0140.
[IEEE Style]
S. Ma, W. Liu, C. You, S. Jia, Y. Wu, "An Improved Defect Detection Algorithm of Jean Fabric Based on Optimized Gabor Filter," Journal of Information Processing Systems, vol. 16, no. 5, pp. 1008-1014, 2020. DOI: 10.3745/JIPS.02.0140.
[ACM Style]
Shuangbao Ma, Wen Liu, Changli You, Shulin Jia, and Yurong Wu. 2020. An Improved Defect Detection Algorithm of Jean Fabric Based on Optimized Gabor Filter. Journal of Information Processing Systems, 16, 5, (2020), 1008-1014. DOI: 10.3745/JIPS.02.0140.