Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development
Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, Takeshi Asakawa, Journal of Information Processing Systems Vol. 4, No. 3, pp. 121-132, Sep. 2008
10.3745/JIPS.2008.4.4.121
Keywords: VLST test, VLSI tester, ATE, tester language, GTL, Tester selection tool
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Cite this article
[APA Style]
Sato, M., Wakamatsu, H., Arai, M., Ichino, K., Iwasaki, K., & Asakawa, T. (2008). Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development. Journal of Information Processing Systems, 4(3), 121-132. DOI: 10.3745/JIPS.2008.4.4.121.
[IEEE Style]
M. Sato, H. Wakamatsu, M. Arai, K. Ichino, K. Iwasaki, T. Asakawa, "Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development," Journal of Information Processing Systems, vol. 4, no. 3, pp. 121-132, 2008. DOI: 10.3745/JIPS.2008.4.4.121.
[ACM Style]
Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, and Takeshi Asakawa. 2008. Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development. Journal of Information Processing Systems, 4, 3, (2008), 121-132. DOI: 10.3745/JIPS.2008.4.4.121.