Search Word(s) in Title, Keywords, Authors, and Abstract: VLST test

Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development
Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki and Takeshi Asakawa
Page: 121~132, Vol. 4, No.4, 2008
10.3745/JIPS.2008.4.4.121
Keywords: VLST test, VLSI tester, ATE, tester language, GTL, Tester selection tool
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