Search Word(s) in Title, Keywords, Authors, and Abstract: Pin Ng

Incremental Model-based Test Suite Reduction with Formal Concept Analysis
Pin Ng, Richard Y. K. Fung and Ray W. M. Kong
Page: 197~208, Vol. 6, No.2, 2010
10.3745/JIPS.2010.6.2.197
Keywords: Test Suite Reduction, Model-based Testing, State Machine Model, Formal Concept Analysis
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