Search Word(s) in Title, Keywords, Authors, and Abstract: GTL

Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development
Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki and Takeshi Asakawa
Page: 121~132, Vol. 4, No.4, 2008
10.3745/JIPS.2008.4.4.121
Keywords: VLST test, VLSI tester, ATE, tester language, GTL, Tester selection tool
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