A Method of Coupling Expected Patch Log Likelihood and Guided Filtering for Image Denoising

Shunfeng Wang, Jiacen Xie, Yuhui Zheng, Jin Wang and Tao Jiang
Volume: 14, No: 2, Page: 552 ~ 562, Year: 2018
10.3745/JIPS.02.0085
Keywords: Edge Preserving, Expected Patch Log Likelihood, Image De-noising, Guided Filtering
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Abstract
With the advent of the information society, image restoration technology has aroused considerable interest. Guided image filtering is more effective in suppressing noise in homogeneous regions, but its edge-preserving property is poor. As such, the critical part of guided filtering lies in the selection of the guided image. The result of the Expected Patch Log Likelihood (EPLL) method maintains a good structure, but it is easy to produce the ladder effect in homogeneous areas. According to the complementarity of EPLL with guided filtering, we propose a method of coupling EPLL and guided filtering for image de-noising. The EPLL model is adopted to construct the guided image for the guided filtering, which can provide better structural information for the guided filtering. Meanwhile, with the secondary smoothing of guided image filtering in image homogenization areas, we can improve the noise suppression effect in those areas while reducing the ladder effect brought about by the EPLL. The experimental results show that it not only retains the excellent performance of EPLL, but also produces better visual effects and a higher peak signal-to-noise ratio by adopting the proposed method.

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Cite this article
IEEE Style
Shunfeng Wang, Jiacen Xie, Yuhui Zheng, Jin Wang, and Tao Jiang , "A Method of Coupling Expected Patch Log Likelihood and Guided Filtering for Image Denoising," Journal of Information Processing Systems, vol. 14, no. 2, pp. 552~562, 2018. DOI: 10.3745/JIPS.02.0085.

ACM Style
Shunfeng Wang, Jiacen Xie, Yuhui Zheng, Jin Wang, and Tao Jiang , "A Method of Coupling Expected Patch Log Likelihood and Guided Filtering for Image Denoising," Journal of Information Processing Systems, 14, 2, (2018), 552~562. DOI: 10.3745/JIPS.02.0085.