Digital Library
Search: "[ keyword: ASED ]" (60)
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S, eep K. Singh, Sangeeta Sabharwal, J.P.Gupta
Vol. 8, No. 2, pp. 213-240, Jun. 2012
10.3745/JIPS.2012.8.2.213
Keywords: events, Event Meta Model, Testing, Test Cases, Test scenarios, Event Based Systems, Software Engineering -
Praveen Ranjan Srivastava
Vol. 8, No. 1, pp. 21-54, Mar. 2012
10.3745/JIPS.2012.8.1.021
Keywords: Software Testing, Fuzzy Multi-Criteria Approach, Fuzzy Logic, Fuzzy Rules Based, Confidence, Centre of Gravity, Fault Tolerance, Kilo Line of Code (KLOC), Software Development Effort (SDE), Software Test Effort (STE), Decision Makers (DM) -
Joon-Min Gil, Mihye Kim
Vol. 7, No. 4, pp. 707-716, Dec. 2011
10.3745/JIPS.2011.7.4.707
Keywords: Desktop Grids, Execution Behavior, Log Analysis System, REST Web Services, Resource Group-based Task Scheduling -
Ruchika Malhotra, Mohit Garg
Vol. 7, No. 2, pp. 363-384, Jun. 2011
10.3745/JIPS.2011.7.2.363
Keywords: Software Testing, Adequacy Based Testing Criteria, Reliability Based Testing Criteria, Genetic Algorithms, Mutation Analysis -
Mengsong Zou, Lansheng Han, Ming Liu, Qiwen Liu
Vol. 7, No. 1, pp. 173-186, Mar. 2011
10.3745/JIPS.2011.7.1.173
Keywords: computer virus, Behavior-Based Detection, Dynamic Link Library, Behavior Resource Tree -
Mohammed Alzaabi, Chan Yeob Yeun, Thomas Anthony Martin
Vol. 7, No. 1, pp. 121-136, Mar. 2011
10.3745/JIPS.2011.7.1.121
Keywords: Location based services, Anonymity, Location Information -
Divyan M. Konidala, Daeyoung Kim, Chan Yeob Yeun, Byoungcheon Lee
Vol. 7, No. 1, pp. 111-120, Mar. 2011
10.3745/JIPS.2011.7.1.111
Keywords: RFID, Smart Home, Home Network System, Home Server, Secure RFIDBased Applications, RFID Reader-Enabled Devices, RFID Tagged Consumer Items, EPCglobal Architecture Framework -
Ui Jin Jang, Hyung-Min Lim, Yong-Tae Shin
Vol. 6, No. 2, pp. 253-260, Jun. 2010
10.3745/JIPS.2010.6.2.253
Keywords: digital forensic, DRM, IP-Based Network -
Pin Ng, Richard Y. K. Fung, Ray W. M. Kong
Vol. 6, No. 2, pp. 197-208, Jun. 2010
10.3745/JIPS.2010.6.2.197
Keywords: Test Suite Reduction, Model-Based Testing, State Machine Model, Formal Concept Analysis -
Feng Yu, Damalie Oyana, Wen-Chi Hou, Michael Wainer
Vol. 6, No. 1, pp. 67-78, Mar. 2010
10.3745/JIPS.2010.6.1.067
Keywords: Grid Density-Based Clustering, Approximate Cluster Analysis, Discrete Cosine Transform, Sampling, Data Reconstruction, Data Compression